Feasibility and limitation of track studies using atomic force microscopy

Feasibility and limitation of track studies using atomic force microscopy

Atomic force microscopy (AFM) has been employed to investigate characteristics of tracks of heavy charged particles in solid state nuclear track detectors (SSNTDs). In the present work, we have performed simulations of the track structures revealed by AFM based only on geometrical considerations of the tracks and two types of probes (the ultralever and the ultrahigh aspect ration probe). The pu...

Atomic Force Microscopy Application in Biological Research: A Review Study

Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...

Surface Evaluation of Resin Zein Films Containing Sugar Plasticizers by Permeability and Atomic Force Microscopy Analysis

     Zein is one of the best biopolymer for edible film making and sugars are natural plasticizers for biopolymers. In this research, sugars (fructose, galactose and glucose) at three levels (0.5, 0.7, 1 g/g of zein) were used as plasticizers for zein protein films and their water vapor permeability (WVP), oxygen permeability (OP) and atomic force microscopy (AFM) topography were studied. The p...

Robust atomic force microscopy using multiple sensors.

Atomic force microscopy typically relies on high-resolution high-bandwidth cantilever deflection measurements based control for imaging and estimating sample topography and properties. More precisely, in amplitude-modulation atomic force microscopy (AM-AFM), the control effort that regulates deflection amplitude is used as an estimate of sample topography; similarly, contact-mode AFM uses regul...

Crystal Lattice Imaging Using Atomic Force Microscopy